Messung eines Objekts basierend auf einem Reflexionsprofil

Details

Veröffentlichungs-Nr.

EP3540689

Aktenzeichen

EP19156619

Anmeldetag

12. Februar 2019

Veröffentlichung

27. April 2022

Erteilung

27. April 2022

Rechtsraum

EP

IPC

G06T7/00

Abstract

An image processing system, an image processing device and an image processing method are provided. A control device (100) controls a light emission portion (4) in a manner that each of plural types of partial regions (43) set on a light emission surface (40) emits light, and controls a camera (8) to image an object (W) in synchronization with light emission of each of the plural types of partial regions (43). The control device (100) performs an image measurement of the object (W) based on reflection profile information (70) which is generated based on a plurality of input images (D), and shows a relationship between positions within the light emission surface (40) and degrees of light (L) reflected to attention sites (A) of the object (W) and incident to the imaging portion (8) with respect to light (Li) irradiated from the positions to the object (W).

Anmelder

Firma

OMRON Corporation

Land

🇯🇵 Japan

Fachgebiete