Röntgenstrahlenanalysator
Anmelder: JEOL Ltd., Jeol Ltd. 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP3745122
- Aktenzeichen
- EP20176853
- Anmeldetag
- 27. Mai 2020
- Veröffentlichung
- 1. Mai 2024
- Erteilung
- 1. Mai 2024
- Rechtsraum
- EP
- IPC
- G01N23/225G01N23/207G01N23/223G01N23/2209
Abstract
An X-ray analyzer (100) includes: a specimen stage (15); a spectrometer (18) having a spectroscopic element and an X-ray detector (17); a temperature measuring unit (20) including at least one of a first temperature sensor (22) for measuring a temperature of the specimen stage (15) and a second temperature sensor (24) for measuring a temperature of the spectrometer (18); a storage unit (42) which stores calibration data of the spectrometer (18), and a previous measurement result by the temperature measuring unit (20) at the time of execution of the calibration of the spectrometer (18); and a notifying unit (34) which acquires a measurement result by the temperature measuring unit (20), calculates a temperature variation amount of the acquired measurement result with respect to the previous measurement result stored in the storage unit (42), and notifies that calibration is needed, based on the temperature variation amount.
Anmelder
- Firmen
- JEOL Ltd.
Jeol Ltd. - Land
- 🇯🇵 Japan
Japanisches Unternehmen mit Sitz in Tokio, das wissenschaftliche und industrielle Präzisionsgeräte entwickelt, darunter Elektronenmikroskope, Analysegeräte und Halbleiterfertigungsanlagen.
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