Röntgenstrahlenanalysator

EP3745122 Art B1 1. Mai 2024

Anmelder: JEOL Ltd., Jeol Ltd. 🇯🇵

Details

Veröffentlichungs-Nr.
EP3745122
Aktenzeichen
EP20176853
Anmeldetag
27. Mai 2020
Veröffentlichung
1. Mai 2024
Erteilung
1. Mai 2024
Rechtsraum
EP
IPC
G01N23/225G01N23/207G01N23/223G01N23/2209
Offizieller Volltext

Abstract

An X-ray analyzer (100) includes: a specimen stage (15); a spectrometer (18) having a spectroscopic element and an X-ray detector (17); a temperature measuring unit (20) including at least one of a first temperature sensor (22) for measuring a temperature of the specimen stage (15) and a second temperature sensor (24) for measuring a temperature of the spectrometer (18); a storage unit (42) which stores calibration data of the spectrometer (18), and a previous measurement result by the temperature measuring unit (20) at the time of execution of the calibration of the spectrometer (18); and a notifying unit (34) which acquires a measurement result by the temperature measuring unit (20), calculates a temperature variation amount of the acquired measurement result with respect to the previous measurement result stored in the storage unit (42), and notifies that calibration is needed, based on the temperature variation amount.

Anmelder

Firmen
JEOL Ltd.
Jeol Ltd.
Land
🇯🇵 Japan
🇯🇵 JEOL

Japanisches Unternehmen mit Sitz in Tokio, das wissenschaftliche und industrielle Präzisionsgeräte entwickelt, darunter Elektronenmikroskope, Analysegeräte und Halbleiterfertigungsanlagen.

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