Analyseverfahren und Röntgenfluoreszenzanalysator
Anmelder: JEOL Ltd., Jeol Ltd. 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP3885758
- Aktenzeichen
- EP21161439
- Anmeldetag
- 9. März 2021
- Veröffentlichung
- 6. August 2025
- Erteilung
- 6. August 2025
- Rechtsraum
- EP
- IPC
- G01N23/223
Abstract
An analysis method using an X-ray fluorescence analyzer (100) is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen (S) when the specimen (S) is irradiated with a primary X-ray. The analysis method includes: acquiring a first X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a first take-off angle; acquiring a second X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a second take-off angle that is different from the first take-off angle; and obtaining information on an element in a depth direction of a specimen (S) based on the first X-ray spectrum and the second X-ray spectrum.
Anmelder
- Firmen
- JEOL Ltd.
Jeol Ltd. - Land
- 🇯🇵 Japan
Japanisches Unternehmen mit Sitz in Tokio, das wissenschaftliche und industrielle Präzisionsgeräte entwickelt, darunter Elektronenmikroskope, Analysegeräte und Halbleiterfertigungsanlagen.
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