Vorspannungsgeneratorprüfung mit Gruppierten Vorspannungsströmen
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP4261549
- Aktenzeichen
- EP22305546
- Anmeldetag
- 14. April 2022
- Veröffentlichung
- 25. September 2024
- Erteilung
- 25. September 2024
- Rechtsraum
- EP
- IPC
- G01R19/165G01R19/00G01R31/28
Abstract
An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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