Abbildungsvorrichtung und Verfahren zum Ausrichten von Bildern
Anmelder: Leica Microsystems CMS GmbH 🇩🇪
Details
- Veröffentlichungs-Nr.
- EP4293408
- Aktenzeichen
- EP22178948
- Anmeldetag
- 14. Juni 2022
- Veröffentlichung
- 20. Dezember 2023
- Rechtsraum
- EP
- IPC
- G02B21/36G02B27/10G02B21/24G02B21/16G02B21/26G06T7/10G06T7/30
Abstract
An imaging device (100) comprises a detection optics (108) configured to receive detection light from a sample (102), and to direct the detection light into a main beam path (110). The imaging device (100) also comprises a beam splitting element (112) configured to be inserted into the main beam path (110), to direct a first part of the detection light into a first branched beam path (114), and to direct a second part of the detection light into a second branched beam path (116). At least one first filter element (122) is configured to be inserted into the first branched beam path (114). A first detector element (120) is arranged in the first branched beam path (114), and configured to capture at least a first test image when the beam splitting element (112) is inserted into the main beam path (110) and the first filter element (122) is not inserted into the first branched beam path (114), a third test image the first filter element (122) is inserted into the first branched beam path (114), and a first actual image. At least one second filter element (128) is configured to be inserted into the second branched beam path (116). A second detector element (126) is arranged in the second branched beam path (116), and configured to capture at least a second test image when the beam splitting element (112) is inserted into the main beam path (110) and the second filter element (128) is not inserted into the second branched beam path (116), a fourth test image when the second filter element (128) is inserted into the second branched beam path (116), and a second actual image. The imaging device (100) further comprises a controller (130) configured to determine a first misalignment between the first test image and the second test image, a second misalignment between the third test image and the first test image, and a third misalignment between the fourth test image and the second test image; and to align the first actual image and the second actual image based on the first misalignment, the second misalignment, and the third misalignment.
Anmelder
- Firma
- Leica Microsystems CMS GmbH
- Land
- 🇩🇪 Deutschland
Deutsches Unternehmen für optische und digitale Mikroskopie, entwickelt Mikroskope und Bildgebungssysteme für Forschung, Industrie und medizinische Diagnostik.
770 Patente in unserer Datenbank