Massenproduktionsprüfung für Träger-In-Paket mit Bordwellenleiter

Details

Veröffentlichungs-Nr.

EP4471433

Aktenzeichen

EP24173080

Anmeldetag

29. April 2024

Veröffentlichung

25. Februar 2026

Erteilung

25. Februar 2026

Rechtsraum

EP

IPC

G01R1/04G01R31/28G01R31/302

Abstract

A two-stage test process for testing IC packages having integrated launchers includes a first stage in which an RF-accurate test process is used to perform RF-accurate tests on a sample set of IC packages to obtain RF-accurate test results and a loop-back test process is performed to obtain loop-back test results. Test characterization data is obtained by comparing the RF-accurate test results to the loop-back test results. In a second stage, larger-scale testing is performed solely with the loop-back test process, and the loop-back test results for each tested IC package are compared with the test characterization data to characterize the test operation of the tested IC package. The loop-back test process can employ a test jig employing a PCB-mounted or PCB-integrated loop-back structure for relatively rapid test setup and test processing.

Anmelder

Firma

NXP B.V.

Land

🇳🇱 Niederlande

Fachgebiete