Spektralbildanalyse mittels Integrationsbeschränkter Anpassung
Anmelder: FEI Company, Universiteit Antwerpen 🇺🇸
Details
- Veröffentlichungs-Nr.
- EP4621396
- Aktenzeichen
- EP24164816
- Anmeldetag
- 20. März 2024
- Veröffentlichung
- 24. September 2025
- Rechtsraum
- EP
- IPC
- G01N23/06G06T7/11G06V10/762
Abstract
Systems or techniques are provided for facilitating spectral image analysis via integration-constrained fitting. In various embodiments, a system can access a spectral image of a specimen captured by a scientific instrument, wherein pixels of the spectral image respectively correspond to energy spectra. In various aspects, the system can fit in pixel-wise fashion a function to the energy spectra, wherein the function comprises a plurality of terms that are additively combined, wherein a first term of the plurality of terms represents a fine structure of the energy spectra, and wherein an integral associated with the first term is constrained to zero. In various instances, the system can segment the spectral image by material, based on the first term.
Anmelder
- Firmen
- FEI Company
Universiteit Antwerpen - Land
- 🇺🇸 USA
US-amerikanischer Hersteller von Elektronenmikroskopen und wissenschaftlichen Bildgebungssystemen, seit 2016 Teil von Thermo Fisher Scientific. Patente betreffen Elektronen- und Ionenmikroskopie sowie Materialanalyse.
506 Patente in unserer Datenbank