System mit Geladenem Teilchenstrahl und Verfahren zur Steuerung des Systems mit Geladenem Teilchenstrahl
Anmelder: Jeol Ltd. 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4621825
- Aktenzeichen
- EP25162131
- Anmeldetag
- 6. März 2025
- Veröffentlichung
- 15. Oktober 2025
- Rechtsraum
- EP
- IPC
- H01J37/18H01J37/16H01J37/20H01J37/26
Abstract
A charged particle beam system includes: a sample chamber (202); a pre-evacuation chamber (232) that is connected to the sample chamber (202); a first evacuation pump (510) that has a first port (512) connected to the sample chamber (202), and a second port (514) connected to the pre-evacuation chamber (232); a second evacuation pump (520) that is connected to the pre-evacuation chamber (232), an evacuation port (516), and the sample chamber (202); and a controller (400) that controls the first evacuation pump (510) and the second evacuation pump (520), the controller (400) performing, when a sample (S) is introduced into the pre-evacuation chamber (232): a process of causing the second evacuation pump (520) to evacuate the pre-evacuation chamber (232); a process of making a determination of whether a vacuum degree inside the pre-evacuation chamber (232) has reached a first vacuum degree, based on power of the second evacuation pump (520); and a process of causing the first evacuation pump (510) to evacuate the pre-evacuation chamber (232) when the vacuum degree inside the pre-evacuation chamber (232) is determined to have reached the first vacuum degree.
Anmelder
- Firma
- Jeol Ltd.
- Land
- 🇯🇵 Japan
Japanisches Unternehmen mit Sitz in Tokio, das wissenschaftliche und industrielle Präzisionsgeräte entwickelt, darunter Elektronenmikroskope, Analysegeräte und Halbleiterfertigungsanlagen.
520 Patente in unserer Datenbank