Störungsdetektor
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP4718306
- Anmeldetag
- 27. September 2024
- Veröffentlichung
- 1. April 2026
- Rechtsraum
- EP
- IPC
- G06F21/75
Abstract
The disclosure relates to voltage glitch detection in an integrated circuit for detection of fault injection attacks. Example embodiments include an integrated circuit (411) comprising: a hardware accelerator (412) including a computing module (413<sub>1</sub>, 413<sub>2</sub>) configured to perform a computing function; and a glitch detector (416<sub>1</sub>, 416<sub>2</sub>) including a delay function (413<sub>1</sub>, 413<sub>2</sub>) and a comparator (419<sub>1</sub>, 419<sub>2</sub>) arranged to compare an output from the delay function (413<sub>1</sub>, 413<sub>2</sub>) with an expected result to provide an output for detecting a glitch, wherein the delay function (413<sub>1</sub>, 413<sub>2</sub>) of the glitch detector (416<sub>1</sub>, 416<sub>2</sub>) is provided at least in part by the computing function of the computing module (413<sub>1</sub>, 413<sub>2</sub>) in the hardware accelerator (412).
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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