Bestimmung eines Temperaturplans einer Integrierten Schaltung

Details

Veröffentlichungs-Nr.

EP4730190

Anmeldetag

16. Oktober 2024

Veröffentlichung

22. April 2026

Rechtsraum

EP

Abstract

A method for determining a temperature map (70, 800) at a target resolution of an IC design (10), the method comprising: determining (200) a high-resolution power map (20) and a low-resolution power map (30); determining (400) a low-resolution temperature map (40) corresponding to the low-resolution power map; up-sampling (500) the low-resolution temperature map to the target resolution to obtain an intermediate temperature map (50); and for one or more ROIs: up-sampling (600) the low-resolution power map in the ROI (203) to the first, high resolution to obtain a local intermediate power map in the ROI (303); determining a difference between (601) the local intermediate power map and the high-resolution power map in the ROI (202), thereby obtaining a local differential power map (61) in the first, high resolution for the ROI; and determining (602) a local differential temperature map (62) in the target resolution corresponding to the local differential power map; and combining (700) the local differential temperature map with the intermediate temperature map in the ROI.

Anmelder

Firma

Imec VZW

Land

🇧🇪 Belgien