Probenverarbeitungsvorrichtung und Probenverarbeitungsverfahren
Anmelder: Jeol Ltd. 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4733738
- Anmeldetag
- 17. Oktober 2025
- Veröffentlichung
- 29. April 2026
- Rechtsraum
- EP
- IPC
- (NOMARU KEIJI et al.)
Abstract
A sample processing apparatus (100) that irradiates a sample (S) disposed in a sample chamber (12) with a processing beam to process the sample (S), the sample processing apparatus (100) includes: a processing beam source (30) that irradiates the sample (S) with the processing beam; a sample holder (50) that holds the sample (S); a sample stage (40) on which the sample holder (50) is mounted; and a shield (60) disposed in the sample chamber (12), wherein the sample holder (50) and the shield (60) form a container (2) that accommodates the sample (S), and the container (2) is provided with a window portion (64) that guides the processing beam into the container (2).
Anmelder
- Firma
- Jeol Ltd.
- Land
- 🇯🇵 Japan
Japanisches Unternehmen mit Sitz in Tokio, das wissenschaftliche und industrielle Präzisionsgeräte entwickelt, darunter Elektronenmikroskope, Analysegeräte und Halbleiterfertigungsanlagen.
520 Patente in unserer Datenbank