Verfahren zur Ermittlung von Defektdaten unter Verwendung mehrerer Verlustfunktionen

Details

Veröffentlichungs-Nr.

EP4734063

Anmeldetag

23. Oktober 2025

Veröffentlichung

29. April 2026

Rechtsraum

EP

IPC

G06T11/00, G06T7/00

Abstract

Disclosed is a method for obtaining training data using a neural network model, the method performed by one or more processors of a computing device according to an exemplary embodiment of the present disclosure.the method may include: obtaining a training image including an object having a first defect; obtaining a predicted image including a second defect using a neural network model; calculating a plurality of loss functions based on the training image and the predicted image; and calculating a final loss function based on the plurality of loss functions; and training the neural network model based on the final loss function.

Anmelder

Firma

AIVEX Co., Ltd.

Land

🇰🇷 Südkorea

Fachgebiete