Fehlererkennungsverfahren und -Vorrichtung, Elektronische Vorrichtung, Speichermedium und Programmprodukt

Details

Veröffentlichungs-Nr.

EP4742150

Anmeldetag

11. September 2024

Veröffentlichung

15. Mai 2025

Rechtsraum

EP

IPC

G06T7/00

Abstract

Disclosed in the embodiments of the present application are a defect detection method and apparatus, an electronic device, a storage medium and a program product. The method comprises: acquiring an image under test of a target workpiece and a template image of the target workpiece, and comparing the image under test with the template image so as to obtain a differential image; inputting the image under test and the differential image into a defect detection model, and executing the following processing: on the basis of the image under test and the differential image, extracting a target image feature and, on the basis of the target image feature, performing defect detection on the image under test to obtain defect detection box information of the image under test; positioning a defect area in the differential image and, according to the defect area, determining a first detection result of the target workpiece; and, according to the defect detection box information and the first detection result, determining a second detection result of the target workpiece.

Anmelder

Firma

Tencent Technology (Shenzhen) Company Limited

Land

🇨🇳 China