Automatisierte Analysevorrichtung und Steuerungsverfahren dafür

Details

Veröffentlichungs-Nr.

EP4756433

Anmeldetag

1. Juli 2024

Veröffentlichung

6. Februar 2025

Rechtsraum

EP

IPC

G01N35/10

Abstract

An object of the present invention is to reduce a replacement frequency of a probe cleaner in an automatic analysis device using a plurality of probe cleaners and a control method for the same. An automatic analysis device according to the present invention includes a dispensing probe that performs aspiration and discharge of at least one of a reagent and a sample and a liquid delivery mechanism that delivers each of a first probe cleaner and a second probe cleaner for cleaning the dispensing probe, a heterogeneous probe cleaner region in which the first probe cleaner and the second probe cleaner may exist, and a storage unit that stores a type of the probe cleaner existing in the heterogeneous probe cleaner region (see Fig. 5).

Anmelder

Firma

HITACHI HIGH-TECH CORPORATION

Land

🇯🇵 Japan

Fachgebiete