Elektronenstrahlformung für Energieanalysatoren
Anmelder: SPECS Surface Nano Analysis GmbH 🇩🇪
Details
- Veröffentlichungs-Nr.
- EP4765189
- Anmeldetag
- 23. Dezember 2024
- Veröffentlichung
- 24. Juni 2026
- Rechtsraum
- EP
- IPC
- H01J49/06, // H01J49/46
Abstract
The invention relates to an electron imaging apparatus (23) configured to be connected to an energy analyzer apparatus. The electron imaging apparatus comprises a receiving aperture (22), a control unit, and a field generating unit (65). The receiving aperture is configured for receiving electrons from a focal volume (200) which form an electron beam (25). The control unit is configured for providing a control signal to the field generating unit based on a desired height of the electron beam in an energy dispersive direction (y) of the energy analyzer apparatus at a proximal end (90) of the electron imaging apparatus and a desired angular distribution (αp) in the energy dispersive direction at the proximal end. The field generating unit is configured for generating at least one electrostatic, magnetic, or electrostatic and magnetic field based on the at least one control signal such that the at least one electrostatic, magnetic, or electrostatic and magnetic field is configured for exerting a force on the electrons of the electron beam in the energy dispersive direction such that a height of the electron beam in the energy dispersive direction at the proximal end corresponds to the desired height in the energy dispersive direction at the proximal end and an angular distribution in the energy dispersive direction at the proximal end corresponds to the desired angular distribution in the energy dispersive direction at the proximal end.
Anmelder
- Firma
- SPECS Surface Nano Analysis GmbH
- Land
- 🇩🇪 Deutschland