System und Verfahren zur Optischen Messung von mindestens Zwei Verschiedenen Umgebungsparametern

Details

Veröffentlichungs-Nr.

EP4772841

Anmeldetag

11. Dezember 2025

Veröffentlichung

8. Juli 2026

Rechtsraum

EP

IPC

G01D5/353, G01K11/32, G01L1/24

Abstract

A system and a method for measuring at least two different environmental parameters of at least one optically reflective sensor in an optical waveguide comprising at least two orthogonal propagation modes, the optical waveguide further comprising an optical delay component, wherein the optical delay component defines a different propagation duration for one propagation mode relative to the other propagation mode, the system further comprising a measurement subsystem optically coupled to the optical waveguide, wherein a light emitter is configured to emit an unpolarized light pulse into the optical waveguide through the optical delay component towards the at least one optically reflective sensor, and wherein a light detector is configured for detecting a first reflection pulse and a second reflection pulse reflected by the at least one optically reflective sensor, and wherein a time difference between the first time and the second time relates to the different propagation duration of the at least two orthogonal propagation modes, caused by the optical delay component.

Anmelder

Firma

PhotonFirst IP B.V.

Land

🇳🇱 Niederlande

Fachgebiete