Doppelkammspektroskopie zur Messung der Dicke einer Bahn

Details

Veröffentlichungs-Nr.

EP4775925

Anmeldetag

9. Januar 2026

Veröffentlichung

15. Juli 2026

Rechtsraum

EP

IPC

G01B11/06

Abstract

The present disclosure provides a method comprising generating, by a dual frequency comb source, a first optical frequency comb having a first repetition rate and a second optical frequency comb having a second repetition rate that is different from the first repetition rate. The method includes directing, using one or more optical elements, one or more of the first optical frequency comb or the second optical frequency comb toward a material. The method includes detecting, using a diode photodetector, optical signals from the first optical frequency comb and the second optical frequency comb after interaction of one or more of the first optical frequency comb or the second optical frequency comb with the material. The method includes generating, using the diode photodetector, a radio frequency signal corresponding to the optical signals. The method includes determining a thickness of the material based on the radio frequency signal.

Anmelder

Firma

Honeywell International Inc.

Land

🇺🇸 USA

Fachgebiete