Detektor und Analysegerät
Anmelder: Jeol Ltd. 🇯🇵
Details
- Veröffentlichungs-Nr.
- EP4803936
- Anmeldetag
- 3. März 2026
- Veröffentlichung
- 9. September 2026
- Rechtsraum
- EP
- IPC
- G01T1/24
Abstract
A detector (100) includes: a detecting element (10) that detects X-rays; a cooling element (50) that cools the detecting element (10); and a first shield (30) and a second shield (40) that are disposed between the detecting element (10) and the cooling element (50), wherein the first shield (30) is mainly composed of an element having an atomic number smaller than an average atomic number of materials constituting the second shield (40), a first surface of the first shield (30) and a second surface of the second shield (40) are in contact with each other, and the first surface and the second surface are not fastened to each other.
Anmelder
- Firma
- Jeol Ltd.
- Land
- 🇯🇵 Japan
Japanisches Unternehmen mit Sitz in Tokio, das wissenschaftliche und industrielle Präzisionsgeräte entwickelt, darunter Elektronenmikroskope, Analysegeräte und Halbleiterfertigungsanlagen.
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