Vorrichtung und Verfahren zur Inspektion eines Objekts

Details

Veröffentlichungs-Nr.

EP4814864

Anmeldetag

23. Dezember 2025

Veröffentlichung

30. September 2026

Rechtsraum

EP

IPC

G06T7/00, G01N21/88

Abstract

An apparatus and a method for inspecting an object are disclosed. A method of inspecting an object includes, when defects of a battery are inspected using a line scan camera, a plurality of one-dimensional images consecutively generated when an object is scanned in a unit of lines are combined to generate a two-dimensional local image, the generated two-dimensional local image is preprocessed, and then defects of the object are detected based on the preprocessed two-dimensional local image, and a line unit scanning operation of generating a one-dimensional image and a preprocessing operation of a two-dimensional local image are performed in parallel, or concurrently or simultaneously.

Anmelder

Firma

SAMSUNG SDI CO., LTD.

Land

🇰🇷 Südkorea

Fachgebiete