Pegelschieberschaltung
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP4711779
- Anmeldetag
- 6. Januar 2025
- Veröffentlichung
- 18. März 2026
- Rechtsraum
- EP
- IPC
- G01R31/317, H03K19/0175
Abstract
A level shifter test circuit, method of testing a level shifter test circuit and a semiconductor chip are provided. The circuit comprises a first level shifter for translating a signal from a first domain to a second domain. The first level shifter configured to receive the signal as an input from the first domain; and output a translated signal which has been translated by the first level shifter for the second domain, wherein the translated signal is split between a first output signal and a first level shifter feedback signal. The circuit further comprises test logic configured to receive the first level shifter feedback signal and test operation of the first level shifter.
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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Hardingham, Christopher Mark
NXP Semiconductors · Hamburg