Spannungsstörungsdetektion
Anmelder: NXP B.V. 🇳🇱
Details
- Veröffentlichungs-Nr.
- EP4741845
- Anmeldetag
- 8. November 2024
- Veröffentlichung
- 13. Mai 2026
- Rechtsraum
- EP
- IPC
- (LENTZ ANDREAS et al.)
Abstract
The disclosure relates to a supply voltage glitch detection circuit (300) comprising: a first flip-flop (301) having a data input (302), a clock input (303) and an output (304); a delay circuit (305) having an output (307) connected to the data input of the first flip-flop; a first clock signal divider (308) having a clock input (309) connected to receive an inverted clock signal and an output (312) connected to an input (306) of the delay circuit (305); a second clock signal divider (313) having a clock input (314) connected to receive the clock signal and an output (315) connected to the clock input (303) of the first flip-flop, wherein the circuit (300) is configured to cause a glitch detection signal output to change state upon a supply voltage of the circuit (300) deviating to cause a change in a delay provided by the delay circuit (305).
Anmelder
- Firma
- NXP B.V.
- Land
- 🇳🇱 Niederlande
Niederländischer Halbleiterhersteller mit Sitz in Eindhoven. Entwickelt Chips und Halbleiterlösungen für Automobiltechnik, Kommunikation, Sicherheit sowie industrielle Anwendungen.
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Hardingham, Christopher Mark
NXP Semiconductors · Hamburg