Eingebauter Selbsttest (bist) für einen Speicher mit Redundanzreparatur

Details

Veröffentlichungs-Nr.

EP4745972

Anmeldetag

11. November 2025

Veröffentlichung

20. Mai 2026

Rechtsraum

EP

Abstract

A memory includes a data array divided into a plurality of input/output (IO) groups and a redundant IO group, each group including a set of columns. A column decoder selects one column from each IO group to provide selected data lines, and one column from the redundant group to provide a redundant data line. Repair circuitry, during normal operation, performs column repair using the selected one column from the redundant group to repair a defective column within one of the plurality of IO groups. Read/write circuitry, in response to a read access during a test mode, outputs read data sensed from the redundant data line in parallel with read data sensed from all the selected data lines. Control circuitry, in response to the read access during the test mode, provides the output read data sensed from the redundant data line external to the memory via a memory output pin.

Anmelder

Firma

NXP USA, Inc.

Land

🇺🇸 USA