Gregory, Alexandra Louise

Systems and methods for fast testing of an optical fiber network are provided. A main testing unit and a remote testing unit are optically coupled to opposite extremities of first and second FUT of the network, Each testing unit has a a reflectometric branch with a light source and light detector, and a power meter branch with a power meter but devoid of light sources. Each testing unit also includes a primary switching stage having two unit-side ports optically coupled to the reflectometric branch and power meter branch, respectively, and two network-side ports optically coupled to the first and second FUTs, respectively. In use, optical test signals can be sent from opposite test units into the two FUTs to double the acquisition speed compared to traditional techniques.

Techniques are described herein for improving performance of machine learning model(s) and thresholds utilized in determining whether automated assistant function(s) are to be initiated. A method includes: receiving, via one or more microphones of a client device, audio data that captures a spoken utterance of a user; processing the audio data using a machine learning model to generate a predicted output that indicates a probability of one or more hotwords being present in the audio data; determining that the predicted output satisfies a secondary threshold that is less indicative of the one or more hotwords being present in the audio data than is a primary threshold; in response to determining that the predicted output satisfies the secondary threshold, prompting the user to indicate whether or not the spoken utterance includes a hotword; receiving, from the user, a response to the prompting; and adjusting the primary threshold based on the response.

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Methods and systems for referencing an optical power loss measurement (OPLM) system, and methods and systems for measuring an optical insertion loss of an optical device under test (DUT) using an OPLM system referenced as such. The herein-provided reflectometric one-cord referencing method combines the capabilities of an OPLM system with that of an Optical Time Domain Reflectometer (OTDR). A first test unit comprises an optical source that is used as the light source in the OPLM. A second test unit comprises a power meter which is used as the power meter in the OPLM measurement. Either the first or the second test unit comprises an OTDR acquisition device. The reflectometric one-cord reference measures the connector loss along the reference link using OTDR capabilities of the test unit(s). Once the power reference of the OPLM devices is obtained, the reflectometric one-cord reference method may determine the optical insertion loss of the DUT while eliminating the measured connector loss.

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In order to assist in determining the physical nature of an optical event as monitored by an OTDR in an optical fiber network, there are herein provided OTDR methods and system which leverage historical values measured on reflective events for characterizing events along an optical fiber link. A plurality of OTDR acquisitions is performed toward the optical fiber link over a period of time. Parameters characterizing a target event are derived using the recorded OTDR acquisitions. One of said parameters represents a stability, over the period of time, of a reflectance peak level associated with the event. The event is classified at least based on said stability.

There is provided a photonic integrated apparatus for determining an orientation and/or a position of an optical waveguide, by measuring a relative intensity and a relative phase difference of the probe light signal incident on a sensor array. The phase profile of the probe light signal projected spatially on the sensor array is particularly sensitive to small changes in the optical probe's orientation and distance. The apparatus measures the relative intensity and relative phase difference of the probe light signal incident on a sensor array. A photonic integrated sensor circuit comprises the sensor array and one or more optical interferometric circuits. Changes in the sensed relative intensity and relative phase difference of the probe light signal, as sampled by the sensor array, indicate variations in the relative orientation and/or distance between the optical waveguide and the sensor array.

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