Mitutoyo Corporation Patente

The application relates to a method for generating a shape measurement program for measuring the shape of a workpiece, the method comprising the steps: scanning a measurement space of a shape measurement system with a movable and/or mobile scanning device comprising an imaging device to obtain scanning data; recognizing at least one workpiece in the measurement space by analyzing the scanning data; detecting a position and/or orientation of the at least one workpiece in the measurement space; and generating a shape measurement program including a collision free movement path for a measuring probe of the shape measurement system for measuring the shape of the at least one workpiece. Furthermore, the application relates to a method for conditioning a shape measurement of a workpiece, a method for defining a dimensional measurement equipment, DME, configuration of a shape measurement system, a method generating a shape measurement program for measuring the shape of a workpiece, to a corresponding computer program product and to a corresponding shape measurement system.

The application relates to a method for automatically generating a reference positioning system, RPS, alignment program for shape measurement of a workpiece, the method comprising the steps of: acquiring datum targets of the workpiece from CAD, computer aided design, model information of the workpiece; generating a coordinate system based on the datum targets; determining alignment of the workpiece; and generating, using the coordinate system, a collision free workpiece program and/or a collision free movement path for a measuring probe of a shape measurement system.

The current inventions relates to a method for determining a local height of a location on a sample surface. The invention further relates to a structured light microscope for determining a local height of a location on a sample surface. The invention further relates to a computer readable data carrier comprising a computer program that, when run on a processor of an structured light microscope according to the invention, causes the structured light microscope to perform the method according to the invention.

The invention relates to a method for measuring a first height map and a second height map of a sample surface with a profilometer and combining the first and second height maps to a composite height map. The invention further relates to a profilometer configured for measuring a first height map and a second height map and combining the first and second height maps to a composite height map.

The invention relates to a method for measuring a first height map and a second height map of a sample surface with a profilometer and combining the first and second height maps to a composite height map. The invention further relates to a profilometer configured for measuring a first height map and a second height map and combining the first and second height maps to a composite height map.

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A measuring device includes a measured value obtainer, a display device configured to display a measured value obtained by the measured value obtainer, an illumination device configured to emit a light to the display device, a measurement state obtainer configured to obtain information regarding a state in which a measured value is obtained by the measured value obtainer, and an illumination color changer configured to change a color of the light in accordance with a measurement state obtained by the measurement state obtainer.

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A telecentric optical apparatus that is capable of suppressing an increase in the number of components as well as achieving high precision optical axis alignment, is provided. The telecentric optical apparatus of the present invention is characterized in that it is provided with: a first telecentric lens surface that is provided on an object side; a second telecentric lens surface that is provided on an image side and that shares a focus position with the first telecentric lens surface; and an optical path trimming part that is provided, between the first telecentric lens surface and the second telecentric lens surface, in an outside region, which is located on a side further out than a light passing region having a center thereof located at the focus position, and that changes an optical path such that a light beam incident on the outside region is prevented from contributing to image formation.

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An inductive position detection configuration for stylus position measurement in a scanning probe comprises a stylus position detection portion arranged along a central axis in the probe. The stylus position detection portion includes a field generating coil configuration and top and bottom axial and rotary sensing coil configurations. The field generating coil configuration generates a changing magnetic flux, and coil signals indicate conductive disruptor element and/or stylus positions. A field generating coil coupling and crosstalk reducing configuration couples signal processing and control circuitry to the field generating coil configuration to provide a coil drive signal, and is configured to reduce crosstalk that would otherwise occur if the field generating coil configuration were directly connected to the signal processing and control circuitry without the field generating coil coupling and crosstalk reducing configuration.